The ZapMaster was the first automated, high-speed ESD test system developed to test ICs and advanced electronic devices. The ZapMaster system can be configured from 64 pin (Model 7/1) to a 256 pin (Model 7/4) system in 64 pin increments.

The ZapMaster pioneered the concept of socketed CDM testing and is the only system in the world capable of performing HBM and MM ESD, Latch-up, and CDM testing in one system.

The ZapMaster delivers clean repeatable waveforms to any pin or combination of pins via a fully automated switching matrix and will test up to 8 devices simultaneously. The ZapMaster will supply precise ESD stimuli to selected pin devices and perform failure analysis via a rapid curve trace and optional Vcc/Icc measurements before and after each zap or series of zaps. As zap levels are increased for each series of zaps, failures are detected through a number of user defined failure criteria. The resulting data is displayed, analyzed and stored.

The ZapMaster performs ESD, latch-up and socketed CDM testing to a variety of standards and range of voltages.

ESD