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KeyTek ZapMaster Mk.2 SE - ESD Latch Up Test
KeyTek ZapMaster MK.2 SE - ESD & Latch-Up Test System The KeyTek ZapMaster MK.2 SE (Standards Evolution) enables rapid, high yield testing of complex high-pin count IC devices for ESD & Latch-Up susceptibility – from design through post-production qualification. A reliable, highly efficient and cost-effective turnkey system, it addresses the newly identified "trailing pulse" phenomenon, a hazard that occurs after the main HBM test event, per JEDEC/ESDA.|? Can be configured as 128, 256, 384, 512, or 768 pins? Relay-based for exceptional test speeds and yield? HBM, MM & Latch-Up testing to all relevant industry standards? Low in-use costSemiconductor Test Reps & Distributors List
Building on legendary ESD & Latch-Up Tester Performance & Reliability The new KeyTek ZapMaster MK.2 SE takes the legendary performance, reliability, accuracy and durability of the original KeyTek ZapMaster, and its successor, the KeyTek ZapMaster MK.2, to a new level of functionality.  With enhanced data set features, and a powerful embedded VME controller that controls the system hardware, it handles an enormous amount of test program and result data, and provides greater flexibility to meet the more demanding test needs of integrated system-on-chip designs. Control by the Windows-based software is both intuitive and comprehensive; allows tests to be set up quickly, and helps keep operator and programmer training to a minimum. Space saving 4 sq. ft. footprint.KeyTek ZapMaster MK.2 SE features help you define, achieve and sustain your component reliability objectives – today and tomorrow• Waveform network: 8 site HBM pulse source with 100pF/1500Ω - Patent Pending design ensures waveform compliance for years to come• High voltage power supply chassis – modular chassis with Patent Pending HV isolation enables excellent pulse source analysis• MK.2 Performance SE software features advanced algorithms for accurate switching of HV in support of pulse source technology• Power supply sequencing provides flexibility to test integrated system-on-chip designs• Human Body Model (HBM) per ESDA STM5.1, JEDEC EIA/JESD22-A114, MIL-STD 883E and AEC Q100-002 specifications, 50V to 8kV• Machine Model (MM) per ESDA STM5.2, JEDEC EIA/JESD22-A115, and AEC Q100-003, 50V to 2kV.• Latch-Up testing per JEDEC EIA/JESD 78 and AEC Q100-004 including preconditioning, state read-back & full control of each test pin • Pin Drivers for use during Latch-Up testing and parametric measurements• Up to six separate V/I supplies for DUT power, curve tracing, & latch-up stimulus with 4-wire sensing at the DUT board for high accuracy• Multiple self-test diagnostic routines• Individual pin parametrics allow the user to define V/I levels, compliance ranges, & curve trace parameters for each pin• Enhanced data set features report all data gathered for off-line reduction and analysis• Comprehensive & flexible engineering vector debug feature enables difficult part vectoring setups• Compatible with ALL 256 pin KeyTek ZapMaster test fixtures when equipped with the optional MK.2 to ZapMaster Carrier, and ALL Verifier DUT fixtures when equipped with the optional MK.2 to Verifier DUT adapter

The KeyTek ZapMaster MK.2 SE is covered by warranty, with a range of technical support options available through Thermo’s

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